February 25, 2024

DHEM & Atom Probe combined provide never-seen-before insights and process efficiencies

Scotts Valley, CA February 25, 2024  ALP Inc.’s Differential Hall Effect Metrology […]
November 30, 2023

Electrical profiles of Graded-Ge SiGe films: A New ALPro Capability

Scotts Valley, CA November 30, 2023  As is known in industry ALP’s […]
March 30, 2023

MRS Advances: Paper on completeness and validation of DHEM profile data

Scotts Valley, CA March 30, 2023  ALP published a detailed paper on […]
November 17, 2022

241 ECS: In-depth comparison of Scanning Spreading Resistance Microscopy (SSRM) with Differential Hall Effect Metrology (DHEM) on highly doped Silicon epi materials with imec.

Scotts Valley, CA November 17, 2022  The 241 ECS meeting published interesting […]
September 5, 2022

Journal of Material Science: Differential Hall Effect Metrology (DHEM) used to analyze BF2 and P doped ultra-shallow polySi materials with TSRI.

Scotts Valley, CA September 5, 2022  ALP’s Differential Hall Effect Metrology (DHEM) was used […]
July 15, 2022

Differential Hall Effect Metrology (DHEM) of UV-laser annealed for 3D-stacked CMOS with SCREEN/LASSE

Scotts Valley, CA July 15, 2022  SCREEN/LASSE recently published new ALPro(TM) 100 […]
June 29, 2022

Spreading Resistance Profiling (SRP) vs Differential Hall Effect Metrology (DHEM) with TSRI: New data published at FCMN 2022

Scotts Valley, CA June 29, 2022  The Taiwan Semiconductor Research Institute (TSRI) and […]
May 10, 2022

Differential Hall Effect Metrology (DHEM) vs SSRM with imec: New data published at FCMN 2022

Scotts Valley, CA May 10, 2022  New data from ALP will be […]
February 3, 2022

IEEE JEDS publication on sub-nm carrier profiling in highly doped Epi SiP using Differential Hall Effect Metrology (DHEM)

Scotts Valley, CA February 3, 2022 – ALP published a journal article on […]
July 13, 2021

Applied Materials uses Differential Hall Effect Metrology (DHEM) to understand activation and deactivation in ultra-highly doped n-type Epitaxy

Scotts Valley, CA July 13, 2021 – The Differential Hall Effect Metrology (DHEM) […]