alpinc-logo_02alpinc-logo_02alpinc-logo_02alpinc-logo_02
  • Home
  • Technology
  • Products
  • News
  • Contact Us
✕

February 3, 2022

IEEE JEDS publication on sub-nm carrier profiling in highly doped Epi SiP using Differential Hall Effect Metrology (DHEM)

Scotts Valley, CA February 3, 2022 – ALP published a journal article on […]
Do you like it?
Read more
July 13, 2021

Applied Materials uses Differential Hall Effect Metrology (DHEM) to understand activation and deactivation in ultra-highly doped n-type Epitaxy

Scotts Valley, CA July 13, 2021 – The Differential Hall Effect Metrology (DHEM) […]
Do you like it?
Read more
December 10, 2020

Differential Hall Effect Metrology (DHEM) featured on the cover of EDFA magazine – the renowned failure analysis resource

Scotts Valley, CA Dec 10, 2020 – ALP was invited to publish […]
Do you like it?
Read more

Active Layer Parametrics, Inc. (ALP)

5500 Butler Lane,
Scotts Valley, CA 95066

Contact Us

E-mail us »

Search

✕
Copyright © Active Layer Parametrics, Inc. (ALP). All Rights Reserved. Designed by Meltem Technology, Inc.