ALP wins NSF SBIR Phase II
July 1, 2016
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ALP is awarded a SBIR Phase I grant by National Science Foundation

 

ALP is awarded a SBIR Phase I grant by National Science Foundation (NSF) to develop a novel metrology technology that provides atomic-level resolution in depth-profiling electrical properties of semiconductor layers.

https://www.nsf.gov/awardsearch/showAward?AWD_ID=1519796

 

 

 

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